Benchmarking the device performance at sub 22 nm node technologies using an SoC framework

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2009, Pages

  Shrivastava, Mayank ^a   Verma, Bhaskar ^a   Baghini, M Shojaei ^a   Russ, Christian ^b   Sharma, Dinesh Kumar ^a   Gossner, Harald ^c   Rao, V Ramgopal ^a  

^a Center for Excellence in Nanoelectronics   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^c INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL LENGTH; DEVICE PERFORMANCE; ESD ROBUSTNESS; FINFETS; I/O PERFORMANCE; MIXED MODE; MOSFETS; NODE TECHNOLOGY; NON-PLANAR DEVICES; SOC APPLICATION; SOI DEVICES; SOI-MOSFETS; SYSTEM-ON-CHIP; TCAD SIMULATION; ULTRA-THIN-BODY;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ELECTRON DEVICES; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; MOSFET DEVICES;

PROGRAMMABLE LOGIC CONTROLLERS;

EID: 77952366677     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2009.5424311     Document Type: Conference Paper

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