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Volumn , Issue , 2010, Pages 74-77

Reliability study for high temperature stable conductive adhesives

Author keywords

Contact resistance; Humidity; Isotropic conductive adhesives

Indexed keywords

CONDUCTIVE ADHESIVE; CURING BEHAVIOR; DECOMPOSITION BEHAVIORS; DIFFERENTIAL SCANNING CALORIMETERS; DYNAMIC MECHANICAL ANALYZER; ELECTRICAL RESISTANCES; ELECTRONIC PACKAGING; ENVIRONMENT CONTAMINATION; FINE-PITCH CAPABILITY; GLASS TRANSITION TEMPERATURE; HIGH TEMPERATURE; HUMIDITY; HUMIDITY TESTS; ISOTROPIC CONDUCTIVE ADHESIVES; LOW PROCESSING TEMPERATURE; MATRIX; MOISTURE RESISTANCE; STORAGE MODULI;

EID: 77952348796     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAPM.2010.5441378     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 1
    • 0031098258 scopus 로고    scopus 로고
    • Surface Characteristics, Reliability, and Failure Mechanisms of Tin/Lead, Copper, and Gold Metallizations
    • Johan Liu, Katrin Gustafsson, Zhonghe Lai and Changhai Li, "Surface Characteristics, Reliability, and Failure Mechanisms of Tin/Lead, Copper, and Gold Metallizations," IEEE Trans-CPMT, Vol.20, No.1 (1997), pp.21-30.
    • (1997) IEEE Trans-CPMT , vol.20 , Issue.1 , pp. 21-30
    • Liu, J.1    Gustafsson, K.2    Lai, Z.3    Li, C.4
  • 2
    • 0033320363 scopus 로고    scopus 로고
    • High Performance Conductive Adhesives Filled with Silver Coated Carbon Nanotubes
    • Daoqiang Lu and C.P. Wong, "High Performance Conductive Adhesives Filled with Silver Coated Carbon Nanotubes," IEEE Trans on Electronics Packaging and Manufacturing, Vol.22, No.4 (1999), pp. 324-329.
    • (1999) IEEE Trans on Electronics Packaging and Manufacturing , vol.22 , Issue.4 , pp. 324-329
    • Lu, D.1    Wong, C.P.2
  • 6
    • 0029305739 scopus 로고
    • Reliability Assessment of Isotropically Conductive Adhesive Joints in Surface Mount Applications
    • Roger S. Rorgren and Johan Liu, "Reliability Assessment of Isotropically Conductive Adhesive Joints in Surface Mount Applications," IEEE Trans-CPMT, Vol.18, No.2 (1995), pp. 305-312.
    • (1995) IEEE Trans-CPMT , vol.18 , Issue.2 , pp. 305-312
    • Rorgren, R.S.1    Liu, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.