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Volumn , Issue , 2010, Pages 74-77
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Reliability study for high temperature stable conductive adhesives
a a,b c a,d
b
SMIT Ltd Co
(China)
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Author keywords
Contact resistance; Humidity; Isotropic conductive adhesives
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Indexed keywords
CONDUCTIVE ADHESIVE;
CURING BEHAVIOR;
DECOMPOSITION BEHAVIORS;
DIFFERENTIAL SCANNING CALORIMETERS;
DYNAMIC MECHANICAL ANALYZER;
ELECTRICAL RESISTANCES;
ELECTRONIC PACKAGING;
ENVIRONMENT CONTAMINATION;
FINE-PITCH CAPABILITY;
GLASS TRANSITION TEMPERATURE;
HIGH TEMPERATURE;
HUMIDITY;
HUMIDITY TESTS;
ISOTROPIC CONDUCTIVE ADHESIVES;
LOW PROCESSING TEMPERATURE;
MATRIX;
MOISTURE RESISTANCE;
STORAGE MODULI;
ADHESIVES;
CONTACT RESISTANCE;
CURING;
DIFFERENTIAL SCANNING CALORIMETRY;
ELECTRONICS PACKAGING;
GLASS TRANSITION;
HEMODYNAMICS;
INDEPENDENT COMPONENT ANALYSIS;
JOINING;
MECHANICAL PROPERTIES;
MOISTURE;
PACKAGING;
PEOPLE MOVERS;
PROCESSING;
THERMOGRAVIMETRIC ANALYSIS;
PACKAGING MATERIALS;
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EID: 77952348796
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISAPM.2010.5441378 Document Type: Conference Paper |
Times cited : (3)
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References (6)
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