Distributed-Poole-Frenkel modeling of anomalous resistance scaling and fluctuations in phase-change memory (PCM) devices

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2009, Pages

  Fugazza, D ^a   Ielmini, D ^a   Lavizzari, S ^a   Lacaita, A L ^b  

^a POLITECNICO DI MILANO   (Italy)

^b IFN CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS PHASE; CHALCOGENIDE MATERIALS; CONDUCTION MODELS; CURRENT NOISE; DISTRIBUTED ACTIVATION ENERGIES; IN-PHASE; LOCALIZED STATE; NEW MODEL; NOISE AMPLITUDE; ON-RESISTANCE; POOLE-FRENKEL; POOLE-FRENKEL MODELING; SIZE SCALING;

ACTIVATION ENERGY; ELECTRON DEVICES; PULSE CODE MODULATION;

PHASE CHANGE MEMORY;

EID: 77952332083     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2009.5424238     Document Type: Conference Paper

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