Transient and intermittent fault recovery without rollback

Proceedings - 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1998

Volumn 1998-December, Issue , 1998, Pages 252-260

  Hamilton, S N ^a   Orailoglu, A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DESIGN FOR TESTABILITY; ELECTRIC FAULT CURRENTS; VLSI CIRCUITS;

CHIP DENSITY; EFFECTIVE APPROACHES; FAULT TOLERANT DESIGN; INTERMITTENT FAULT; RECOVERY METHODS; STORAGE HARDWARE; TIMING REQUIREMENTS;

FAULT TOLERANCE;

EID: 77952284014     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.1998.732173     Document Type: Conference Paper

References (8)

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