Structural, compositional and electrochemical characterization of Pt-Co Oxygen-Reduction catalysts

ChemPhysChem

Volumn 11, Issue 7, 2010, Pages 1468-1475

  Axnanda, S ^a   Cummins, K D ^a   He, T ^b   Goodman, D W ^a   Soriaga, M P ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

^b HONDA RESEARCH INSTITUTE   (United States)

Author keywords

Alloys; Electrocatalysts; Electrochemistry; Electron diffraction; Surface chemistry

Indexed keywords

ALLOYING; BINARY ALLOYS; COBALT; CORROSION; ELECTROCATALYSTS; ELECTROCHEMISTRY; ELECTROLYTES; ELECTROLYTIC REDUCTION; ELECTRON DIFFRACTION; ELECTRONS; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; OXYGEN; PHOTOELECTRON SPECTROSCOPY; RUTHENIUM ALLOYS; SINGLE CRYSTALS; SURFACE CHEMISTRY; SURFACE SEGREGATION; TEMPERATURE PROGRAMMED DESORPTION; THIN FILMS;

BULK SINGLE CRYSTALS; ELECTROCHEMICAL CHARACTERIZATIONS; LOW ENERGY ION SCATTERING SPECTROSCOPY; OPEN CIRCUIT POTENTIAL; OXYGEN REDUCTION CATALYSTS; OXYGEN REDUCTION REACTION; THERMODYNAMIC LIMITS; VOLTAGE EFFICIENCIES;

PLATINUM;

EID: 77952168964     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.200900924     Document Type: Article

References (29)

1. C. W. B. Bezerra, L. Zhang, H. Liu, K. Lee, A. L. B. Marques, E. P. Mar ques, H. Wang, J. Zhang, J. Power Sources 2007, 173, 891.
2. V. S. Bagotsky, Fuel Cells: Problems and Solutions, Wiley, New York, 2009.
3. M. Watanabe, K. Tsurumi, T. Mizukami, T. Nakamura, P. Stonehart, J. Elec trochem. Soc. 1994, 141, 2659.
4. K. T. Kim, J. T. Hwang, Y. G. Kim, J. S. Chung, J. Electrochem. Soc. 1993, 140,31.
5. S. Gottesfeld, M. T. Paffett, A. Redondo, J. Electroanal. Chem. 1986, 205, 163.
6. K. A. Daube, M. T. Paffett, S. Gottesfeld, C. T. Campbell, J. Vac. Sci. Tech. A 1986,4,1617.
7. M. T. Paffett, J. G. Berry, S. Gottesfeld, J. Electrochem. Soc. 1988, 135, 1431.
8. M. T. Paffett, K. A. Daube, S. Gottesfeld, C. T. Campbell, J. Electroanal. Chem. 1987, 220, 269.
9. J. T. Glass, J. T. George, G. L. Cahen, G. E. Stoner, E. J. Taylor, J. Electro chem. Soc. 1987, 134, 58.
10. R. R. Adzic, J. Zhang, K. Sasaki, M. B. Vukmirovic, M. Shao, J. X. Wang, A. U. Nilekar, M. Mavrikakis, J. A. Valerio, F. Uribe, Top. Catal. 2007, 46, 249.
11. S. Zignani, E. Antolini, E. R. Gonzalez, J. Power Sources 2008, 182, 83-90.
12. C. A. Lucas, N. M. Markovic, P. N. Ross, Phys. Rev. B 1997, 55, 7964-7971.
13. B. C. Beard, P. N. Ross, J. Electrochem. Soc. 1990, 137, 3368.
14. S. Mukerjee, S. Srinivasan, M. P. Soriaga, J. McBreen, J. Electrochem. Soc. 1995,142,1409.
15. V. Stamenkovič, T. J. Schmidt, N. M. Markovic, P. N. Ross, J. Phys. Chem. B 2002, 106, 11 970-11979
16. J. L. Fernández, J. M. White, Y. Sun, W. Tang, G. Henkelman; A. J. Bard, Langmuir 2006, 22, 10426.
17. C. W. Yi, K. Luo, T. Wei, D. W. Goodman, J. Phys. Chem. B 2005, 109, 18535-40.
18. D. Kumar, M. S. Chen, D. W. Goodman, Thin Solid Films 2007, 515, 1475.
19. Z. P. Luo, Acta. Mater. 2006, 54, 47.
20. A. Asthana, Y. Matsui, M. Yasuda, K. Kimoto, T. Iwata, K. Ohshima, J. Appl. Crystallogr. 2005, 38, 361.
21. H. Niehus, W. Heiland, E. Taglauer, Surf. Sci. Rep. 1993, 17, 213-303.
22. T. Toda, H. Igarashi, H. Uchida, M. Watanabe, J. Electrochem. Soc. 1999, 146,3750-3756.
23. J. L. Fernández, J. M. White, Y. Sun, W. Tang, G. Henkelman, A. J. Bard, Langmuir 2006, 22, 10426-10431. Science 2009, 324, 1302.
24. J. L. Fernández, D. A. Walsh, A. J. Bard, J. Am. Chem. Soc. 2005, 127, 357.
25. B. Lim, M. Jian, P. H. C. Camargo, E. C. Cho, J. Tao, X. Lu, Y. Zhu, Y. Xia, Science 2009, 324, 1302.
26. S. Chen, P. J. Ferreira, W. Sheng, N. Yabuuchi, L. F. Allard, Y. Shao-Horn, J. Am. Chem. Soc. 2008, 130, 13818.
27. S. Koh, P. Strasser, J. Am. Chem. Soc. 2007, 129, 12624.
28. Y. Xu, A. V. Ruban, M. J. Mavrikakis, J. Am. Chem. Soc. 2004, 126, 4717.
29. M. Mavrikakis, B. Hammer, J. K. Norskov, Phys. Rev. Lett. 1998, 81, 2819.