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Volumn 53, Issue , 2010, Pages 9-17

MEMS for automotive and consumer electronics

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOTIVE CRASHES; ELECTRONIC CONTROL SYSTEMS; FASTER RATES; HARD DRIVES; HUMAN NEEDS; MEMS SENSORS; PHYSICAL INJURIES; SENSOR COMPONENTS; STEERING WHEEL;

EID: 77952154194     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2010.5434066     Document Type: Conference Paper
Times cited : (73)

References (17)
  • 1
    • 84925175290 scopus 로고
    • The Resonant Gate Transistor
    • March
    • H.C Nathanson et al.,"The Resonant Gate Transistor", IEEE Transactions on Electron Devices, Vol. 14, Issue 3, pp. 117-133, March 1967.
    • (1967) IEEE Transactions on Electron Devices , vol.14 , Issue.3 , pp. 117-133
    • Nathanson, H.C.1
  • 2
    • 0020735919 scopus 로고
    • Silicon Micromechanical Devices
    • April
    • J.B. Angell et al., "Silicon Micromechanical Devices", Scientific American, Vol. 248, No. 4, pp. 44-55, April 1983.
    • (1983) Scientific American , vol.248 , Issue.4 , pp. 44-55
    • Angell, J.B.1
  • 3
    • 0020127035 scopus 로고
    • Silicon as a Mechanical Material
    • May
    • K.E. Petersen, "Silicon as a Mechanical Material", Proceedings of the IEEE Vol. 70, No. 5, pp. 420-457, May 1982.
    • (1982) Proceedings of the IEEE , vol.70 , Issue.5 , pp. 420-457
    • Petersen, K.E.1
  • 4
    • 77952112275 scopus 로고    scopus 로고
    • iSuppli Corporation
    • "Global MEMS Market Suffers First-Ever Decline in 2008", iSuppli Corporation, 2009 (http://www.isuppli.com/News/Pages/Global-MEMS-Market- Suffers-First-Ever-Decline-in-2008.aspx).
    • (2009) Global MEMS Market Suffers First-Ever Decline in 2008
  • 5
    • 27544461458 scopus 로고    scopus 로고
    • A Novel Micromachining Process for the Fabrication of Monocrystalline Silicon Si-Membranes using Porous Silicon
    • S. Armbruster et al, "A Novel Micromachining Process for the Fabrication of Monocrystalline Silicon Si-Membranes using Porous Silicon", IEEE Transducers 03, pp. 246-249.
    • IEEE Transducers 03 , pp. 246-249
    • Armbruster, S.1
  • 6
    • 0025497593 scopus 로고
    • Silicon Pressure Sensor with Integrated CMOS Signal Conditioning Circuit and Compensation of Temperature Coefficient
    • H. J Kress, F. Bantien, J. Marek, M. Willman,"Silicon Pressure Sensor with Integrated CMOS Signal Conditioning Circuit and Compensation of Temperature Coefficient", Sensors and Actuators A 25, 1991.
    • (1991) Sensors and Actuators A , vol.25
    • Kress, H.J.1    Bantien, F.2    Marek, J.3    Willman, M.4
  • 7
    • 0021491424 scopus 로고
    • MICROSTRUCTURE of POROUS SILICON and ITS EVOLUTION with TEMPERATURE
    • DOI 10.1016/0167-577X(84)90086-7
    • R. Herino, A. Perio, K. Barla, G. Bomchil, "Microstructure of Porous Silicon and its Evolution with Temperature", Matterials Lett. 2, pp. 519-523, 1984. (Pubitemid 15492439)
    • (1984) Materials Letters , vol.2 , Issue.6 A-B , pp. 519-523
    • Herino, R.1    Perio, A.2    Barla, K.3    Bomchil, G.4
  • 16
    • 77952165012 scopus 로고    scopus 로고
    • 49 CFR Part 571, Docket No. NHTSA 2000-8572, RIN 2127-AI33; Federal Motor Vehicle Safety Standards; Tire Pressure Monitoring Systems; Controls and Displays
    • US Department of Transportation, National Highway Traffic Safety Administration, 49 CFR Part 571, Docket No. NHTSA 2000-8572], RIN 2127-AI33; Federal Motor Vehicle Safety Standards; Tire Pressure Monitoring Systems; Controls and Displays, http://www.nhtsa.dot.gov/cars/rules/rulings/ tirepresfinal/index.html


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.