A thermal-diffusivity-based temperature sensor with an untrimmed inaccuracy of ±0.2°C (3σ) from -55°C to 125°C

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 53, Issue , 2010, Pages 314-315

  Van Vroonhoven, Caspar P L ^a   D'Aquino, Dan ^b   Makinwa, Kofi A A ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

A-THERMAL; ABSOLUTE TEMPERATURES; CMOS PROCESSS; DIFFUSIVITIES; DIGITAL OUTPUT; LINEAR FUNCTIONS; LITHOGRAPHIC RESOLUTION; MOORE'S LAW; PACKAGING STRESS;

TEMPERATURE SENSORS;

CMOS INTEGRATED CIRCUITS;

EID: 77952143104     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2010.5433900     Document Type: Conference Paper

References (4)

1. C.P.L. van Vroonhoven, K.A.A. Makinwa, "A CMOS temperature-to- digital converter with an inaccuracy of ±0.5°C (3σ) from -55 to 125°C", IEEE ISSCC Dig. Tech. Papers, pp. 576-577, Feb. 2008.
2. S.M. Kashmiri, S. Xia, K.A.A. Makinwa, "A temperature-to-digital converter based on an optimized electrothermal filter", IEEE Journal of Solid State Circuits, pp. 2026-2035, Jul. 2009.
3. C. Zhang and K.A.A. Makinwa, "The effect of substrate doping on the behaviour of a CMOS electrothermal frequency-locked-loop", Dig. Transducers 2007, pp.2283-2286, Jun. 2007.
4. A.L. Aita, M.A.P. Pertijs, K.A.A. Makinwa and J.H. Huijsing, "A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ±0.25°C (3σ) from -70°C to 130°C", IEEE ISSCC Dig. Tech. Papers, pp. 342-343, Feb. 2009.