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Volumn 13, Issue 2, 2010, Pages

X-ray pinhole camera resolution and emittance measurement

Author keywords

[No Author keywords available]

Indexed keywords


EID: 77952132158     PISSN: None     EISSN: 10984402     Source Type: Journal    
DOI: 10.1103/PhysRevSTAB.13.022805     Document Type: Article
Times cited : (82)

References (12)
  • 5
    • 77952199993 scopus 로고    scopus 로고
    • Spatial Coherency of the Synchrotron Radiation at the Visible Light Region and its Application for Vertical Beam Profile Measurement
    • T. Mitsuhashi, Spatial Coherency of the Synchrotron Radiation at the Visible Light Region and its Application for Vertical Beam Profile Measurement, APS Meeting Abstracts, page 3 (1997).
    • (1997) APS Meeting Abstracts , pp. 3
    • Mitsuhashi, T.1
  • 10
    • 33751200713 scopus 로고    scopus 로고
    • Pearson Education, San Francisco, 4th ed
    • E. Hecht, Optics (Pearson Education, San Francisco, 2004), 4th ed.
    • (2004) Optics
    • Hecht, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.