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Volumn , Issue , 2000, Pages 330-334
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The application of mold flow simulation in electronic package
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC COMPATIBILITY;
MODIFIED ATMOSPHERE PACKAGING;
MOLDING;
MOLDS;
PACKAGING MATERIALS;
SURFACE ROUGHNESS;
CAVITY THICKNESS;
DESIGN CYCLE-TIME;
ELECTRONIC PACKAGE;
MANUFACTURING COST;
MODELING TECHNOLOGY;
MOLDING DEFECTS;
NUMERICAL RESULTS;
SIMULATION MODEL;
PACKAGING;
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EID: 77952009713
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EMAP.2000.904175 Document Type: Conference Paper |
Times cited : (8)
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References (5)
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