SCOPUS 정보 검색 플랫폼

Optoelectronics and Advanced Materials, Rapid Communications

Volumn 3, Issue 1, 2009, Pages 65-68

Metal roughness profile inspection using a micro-displacement fiber optic bundled sensor

(4) Suparta, G B a Nugroho, W a Swakarma, I K b Yasin, M c

a GADJAH MADA UNIVERSITY (Indonesia)

b Department of Mechanical Engineering (Indonesia)

c AIRLANGGA UNIVERSITY (Indonesia)

Author keywords

Computer tomography; Micro displacement sensor; Roughness profile

Indexed keywords

COMPUTERIZED TOMOGRAPHY; DATA ACQUISITION; FIBER OPTICS; IMAGE RECONSTRUCTION; INSPECTION; PROBES;

COMPUTERIZED DATA; INTENSITY MODULATIONS; MICRO DISPLACEMENT; MICROCOMPUTED TOMOGRAPHY; MICRODISPLACEMENT SENSOR; REFLECTING SURFACE; SURFACE PROFILES; TRANSMITTED LIGHT;

SURFACE ROUGHNESS;

EID: 77952001834 PISSN: 18426573 EISSN: 20653824 Source Type: Journal
DOI: None Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.