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Physical Review Letters

Volumn 104, Issue 17, 2010, Pages

Interplay between static and dynamic properties of semifluxons in YBa 2Cu3O7-δ 0-π Josephson junctions

(8) Cedergren, K a Kirtley, J R b Bauch, T a Rotoli, G c Troeman, A d Hilgenkamp, H d Tafuri, F e Lombardi, F a

a CHALMERS UNIVERSITY OF TECHNOLOGY (Sweden)

b STANFORD UNIVERSITY (United States)

c UNIVERSITY OF L'AQUILA (Italy)

d UNIVERSITY OF TWENTE (Netherlands)

e SECOND UNIVERSITY OF NAPLES (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DISCONTINUITY POINTS; FLUXONS; JOSEPHSON JUNCTIONS; SCANNING SQUID MICROSCOPE; SEMIFLUXON; STATIC AND DYNAMIC; ZERO FIELDS;

ELECTRIC LOAD SHEDDING; JOSEPHSON JUNCTION DEVICES; PLATES (STRUCTURAL COMPONENTS);

CURRENT VOLTAGE CHARACTERISTICS;

EID: 77951763510 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.104.177003 Document Type: Article

Times cited : (17)

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