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Volumn 24, Issue 6-7, 2010, Pages 825-834
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Physical properties of contact lenses characterized by scanning probe microscopy and optomagnetic fingerprint
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Author keywords
Atomic force microscopy; Contact lens; Magnetic force microscopy; Optomagnetic fingerprint; Spectral convolution
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Indexed keywords
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EID: 77951686837
PISSN: 02179792
EISSN: None
Source Type: Journal
DOI: 10.1142/S0217979210064460 Document Type: Conference Paper |
Times cited : (14)
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References (10)
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