Patterned growth and field-emission properties of AlN nanocones

ACS Applied Materials and Interfaces

Volumn 1, Issue 9, 2009, Pages 1927-1930

  Ning, Liu ^a   Qiang, Wu ^a   Chengyu, He ^a   Haisheng, Tao ^a   Xizhang, Wang ^a   Wei, Lei ^b   Zheng, Hu ^a  

^a NANJING UNIVERSITY   (China)

^b SOUTHEAST UNIVERSITY   (China)

Author keywords

aluminum nitride; field emission; one dimensional nanostructure; patterned growth

Indexed keywords

ALN NANOCONES; FE PROPERTIES; FIELD EMITTER; FIELD-EMISSION PROPERTIES; NANO SCALE; ONE-DIMENSIONAL NANOSTRUCTURE; PATTERNED GROWTH; SCREENING EFFECT; SI SUBSTRATES; THRESHOLD FIELDS;

ALUMINUM; FIELD EMISSION; NANOSTRUCTURES; NITRIDES;

ALUMINUM NITRIDE;

ALUMINUM CHLORIDE; ALUMINUM DERIVATIVE; ALUMINUM NITRIDE; AMMONIA; CHLORIDE; NANOMATERIAL;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTROCHEMISTRY; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TEMPERATURE; X RAY DIFFRACTION;

ALUMINUM COMPOUNDS; AMMONIA; CHLORIDES; CRYSTALLIZATION; ELECTROCHEMISTRY; MATERIALS TESTING; MICROSCOPY, ELECTRON, SCANNING; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTIES; TEMPERATURE; X-RAY DIFFRACTION;

EID: 77951639426     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am9003304     Document Type: Article

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