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Solid State Sciences

Volumn 12, Issue 5, 2010, Pages 730-735

Thermal and electrical relaxation studies in Li(4+x)TixNb1-xP3O 12 (0.0 ≤ x ≤ 1.0) phosphate glasses

(2) Vinoth Rathan, S a Govindaraj, G a

a PONDICHERRY UNIVERSITY (India)

Author keywords

Dielectric loss; Hunt's model; Impedance spectroscopy; Ionic conductivity; NASICON

Indexed keywords

ARRHENIUS BEHAVIORS; CONDUCTIVITY RELAXATION; ELECTRICAL PROPERTY; ELECTRICAL RELAXATIONS; FREQUENCY RANGES; GLASS FORMING ABILITY; HIGH THERMAL STABILITY; IMPEDANCE SPECTROSCOPY; MELT-QUENCHING; NASICON; PHOSPHATE GLASS; SUPERIONIC; TEMPERATURE RANGE;

ACTIVATION ENERGY; DIELECTRIC DEVICES; DIELECTRIC LOSSES; ELECTRIC PROPERTIES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IONIC CONDUCTIVITY; THERMOGRAVIMETRIC ANALYSIS; X RAY POWDER DIFFRACTION;

GLASS;

EID: 77951620094 PISSN: 12932558 EISSN: None Source Type: Journal
DOI: 10.1016/j.solidstatesciences.2010.02.030 Document Type: Article

Times cited : (49)

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