The physical limits of light trapping in thin-films and photonic structures that operate at the limit

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2009, Pages 002204-002207

  Agrawal, Mukul ^a   Peumans, Peter ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBING LAYERS; ACTIVE MATERIAL; BAND GAPS; CRYSTALLINE SILICON SOLAR CELLS; DEVICE STRUCTURES; GEOMETRIC OPTICS; GEOMETRIC TEXTURE; INCIDENT RAYS; LIGHT-TRAPPING; OPTICAL ABSORPTION; OPTICAL PATH LENGTHS; ORDER OF MAGNITUDE; PHOTONIC STRUCTURE; PHYSICAL LIMITS; POWER CONVERSION EFFICIENCIES; SUB-WAVELENGTH STRUCTURES; THEORETICAL LIMITS; THIN-FILM SOLAR CELLS; TIME EVOLUTIONS; TOTAL INTERNAL REFLECTIONS; UPPER LIMITS;

ABSORPTION; CONVERSION EFFICIENCY; COST REDUCTION; GEOMETRY; INFORMATION THEORY; PHOTOVOLTAIC CELLS; REFRACTIVE INDEX; SOLAR CELLS; TEXTURES;

LIGHT;

EID: 77951604968     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2009.5411387     Document Type: Conference Paper

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