Study of SnS:Bi thin films prepared by sulfurization

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2009, Pages 000852-000856

  Botero, M ^c   Bartolo Perez, P ^b   Calderon, C ^a   Romero, E ^a   Gordillo, G ^a  

^a UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

^b DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

^c UNIVERSIDAD CENTRAL   (Colombia)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBER LAYERS; ABSORPTION COEFFICIENTS; AES DEPTH PROFILE; AUGER ELECTRON SPECTROSCOPY DEPTH PROFILES; BI FILMS; BI THIN FILMS; BI-DOPED; CHEMICAL COMPOSITIONS; ENERGY BANDGAPS; SNS FILMS; SNS THIN FILMS; SPECTRAL TRANSMITTANCE; THIN FILM SOLAR CELLS;

AUGER ELECTRON SPECTROSCOPY; OPTICAL PROPERTIES; STRUCTURAL PROPERTIES; THIN FILMS; X RAY DIFFRACTION;

TIN;

EID: 77951564281     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2009.5411154     Document Type: Conference Paper

References (8)

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