Optimization of traction force microscopy for micron-sized focal adhesions

Journal of Physics Condensed Matter

Volumn 22, Issue 19, 2010, Pages

  Stricker, Jonathan ^a   Sabass, Benedikt ^b   Schwarz, Ulrich S ^b   Gardel, Margaret L ^a  

^a UNIVERSITY OF CHICAGO   (United States)

^b UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADHERENT CELLS; CYTOMETRY; EFFECTIVE AREA; EXTRACELLULAR MATRICES; FOCAL ADHESIONS; INFORMATION LOST; MICRO CONTACT PRINTING; OPTIMAL SETS; POINT FORCE; POSITIVE CORRELATIONS; QUANTITATIVE TECHNIQUES; SPATIAL RESOLUTION; STRESS DISTRIBUTION; STRESS FIELD; STRESS MAGNITUDE; TRACTION FORCES; TRACTION STRESS;

ADHESION; ELECTRIC DISCHARGE MACHINING; ELECTRON DEVICE MANUFACTURE; OPTIMIZATION; STRESS CONCENTRATION; YIELD STRESS;

TRACTION (FRICTION);

ARTICLE; ATOMIC FORCE MICROSCOPY; CELL ADHESION; FOCAL ADHESION; HUMAN; IMAGE ENHANCEMENT; METHODOLOGY; OSTEOSARCOMA; PATHOLOGY; PATHOPHYSIOLOGY; TUMOR CELL LINE;

CELL ADHESION; CELL LINE, TUMOR; FOCAL ADHESIONS; HUMANS; IMAGE ENHANCEMENT; MICROSCOPY, ATOMIC FORCE; OSTEOSARCOMA;

EID: 77951545840     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/19/194104     Document Type: Article

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