Contact resistance measurement techniques for Ag thick-film screen-printed contacts to solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2009, Pages 000960-000963

  Melczarsky, M ^a   Gallego Garcia, G ^a   Posthuma, N E ^a   Van Kerschaver, E ^a   Beaucarne, G ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT AREAS; EDGE EFFECT; FIRING CONDITIONS; METALLIZATIONS; SCANNING ELECTRON MICROSCOPE; SCREEN-PRINTED; TRANSFER LENGTH METHODS;

ELECTRIC RESISTANCE MEASUREMENT; SCANNING ELECTRON MICROSCOPY; SILVER; SOLAR CELLS;

CONTACT RESISTANCE;

EID: 77951539267     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2009.5411130     Document Type: Conference Paper

References (15)

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