Density measurement of samples under high pressure using synchrotron microtomography and diamond anvil cell techniques

Journal of Synchrotron Radiation

Volumn 17, Issue 3, 2010, Pages 360-366

  Xiao, Xianghui ^a   Liu, Haozhe ^b   Wang, Luhong ^b   De Carlo, Francesco ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Equation of state; High pressure; Incomplete data; Microtomography

Indexed keywords

ACCURATE MASS; AMORPHOUS SAMPLES; DENSITY MEASUREMENTS; DIAMOND ANVIL CELL TECHNIQUE; DIAMOND-ANVIL CELL; EQUATION OF STATE; HIGH PRESSURE; ILL POSED; INCOMPLETE DATA; MASS DENSITIES; MICRO-TOMOGRAPHY; PRESSURE STUDIES; SYNCHROTRON MICROTOMOGRAPHY;

AMORPHOUS MATERIALS; DIGITAL INTEGRATED CIRCUITS; EQUATIONS OF STATE; TOMOGRAPHY; TOOLS;

HIGH PRESSURE ENGINEERING;

EID: 77951430519     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049510008502     Document Type: Article

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