Characterization of Frequency Stability

IEEE Transactions on Instrumentation and Measurement

Volumn IM-20, Issue 2, 1971, Pages 105-120

  Barnes, James A ^a   Chi, Andrew R ^b   Cutler, Leonard S ^c   Healey, Daniel J ^d   Leeson, David B ^e   McGunigal, E Thomas ^b   Mullen, James A ^f   Smith, Warren L ^g   Sydnor, Richard L ^h   Vessot, Robert F C ⁱ   Winkler, Gernot M R ^j  

^a NBS ^*  (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c HEWLETT PACKARD COMPANY   (United States)

^d WESTINGHOUSE ELECTRIC COMPANY   (United States)

^e California Microwave Inc Woodland   (United States)

^f RAYTHEON COMPANY   (United States)

^g Stormont Laboratories   (United States)

^h CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

ⁱ SMITHSONIAN ASTROPHYSICAL OBSERVATORY   (United States)

^j US NAVAL OBSERVATORY   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77951296985     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/TIM.1971.5570702     Document Type: Article

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