Ageing of modified wood. Part 2: Determination of surface composition of acetylated, furfurylated, and thermally modified wood by XPS and ToF-SIMS

Holzforschung

Volumn 64, Issue 3, 2010, Pages 305-313

  Bryne, Lars Elof ^a   Lausmaa, Jukka ^b   Ernstsson, Marie ^c   Englund, Finn ^b   Wälinder, Magnus E P ^a,b  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

^c INSTITUTE FOR SURFACE CHEMISTRY   (Sweden)

Author keywords

Acetylation; Electron spectroscopy for chemical analysis (ESCA); Furfurylation; Heat treatment; Modified wood; Surface chemical composition; Time of flight secondary ion mass spectrometry (ToF SIMS); X ray photoelectron spectroscopy (XPS)

Indexed keywords

AGEING EFFECTS; AGEING PROCESS; CHEMICAL COMPOSITIONS; ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS; FURFURYLATION; HYDROPHOBIZATIONS; LOW-VACUUM SCANNING ELECTRON MICROSCOPES; MODIFIED WOOD; PICEA ABIES; PINUS RADIATA; PINUS SYLVESTRIS; RADIATA PINE; SEM; SPECTROSCOPIC INFORMATION; SURFACE CHEMICAL COMPOSITION; SURFACE COMPOSITIONS; THERMALLY MODIFIED WOOD; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; WOOD SAMPLES; WOOD SURFACES; XPS; XPS MEASUREMENTS;

ACETYLATION; CHEMICAL ANALYSIS; CHEMICALS; ELECTRON SPECTROSCOPY; ELECTRONS; FORESTRY; HEAT TREATMENT; IONS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; SPECTRUM ANALYSIS; WETTING; WOOD;

X RAY PHOTOELECTRON SPECTROSCOPY;

ACETYLATION; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; ELECTRON SPECTROSCOPY; ELECTRONS; ESCA; FORESTRY; HEAT TREATMENT; IONS; SCANNING ELECTRON MICROSCOPY; WETTING; WOOD; X RAY SPECTROSCOPY;

PICEA; PICEA ABIES; PINUS RADIATA; PINUS SYLVESTRIS; RADIATA;

EID: 77951280203     PISSN: 00183830     EISSN: 1437434X     Source Type: Journal    
DOI: 10.1515/HF.2010.062     Document Type: Article

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