6 MeV pulsed electron beam induced surface and structural changes in polyimide

Materials Science and Engineering: B

Volumn 168, Issue 1, 2010, Pages 122-126

  Mathakari, Narendra L ^a   Bhoraskar, Vasant N ^a   Dhole, Sanjay D ^a  

^a UNIVERSITY OF PUNE   (India)

Author keywords

AFM; Contact angle; Crosslinking; High energy electron radiation; Polyimide; Profilometry

Indexed keywords

CONTACT ANGLE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; POLYIMIDES; STRESS-STRAIN CURVES; SURFACE PROPERTIES; SURFACE ROUGHNESS; TENSILE STRENGTH; ULTRAVIOLET VISIBLE SPECTROSCOPY;

ATOMIC-FORCE-MICROSCOPY; BULK AND SURFACE PROPERTIES; ELECTRON RADIATION; FOURIER TRANSFORM INFRARED; HIGH-ENERGY ELECTRON; HIGH-ENERGY ELECTRON RADIATION; IRRADIATED SAMPLES; PULSED ELECTRON BEAMS; SURFACE-ROUGHENING; THIN-FILMS;

ATOMIC FORCE MICROSCOPY;

EID: 77951256829     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2009.11.005     Document Type: Article

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