Damage detection using piezoelectric admittance approach with inductive circuitry

Journal of Intelligent Material Systems and Structures

Volumn 21, Issue 7, 2010, Pages 667-676

  Wang, X ^a   Tang, J ^a  

^a University of Connecticut   (United States)

Author keywords

Admittance approach; Damage detection; Frequency veering; Inductive circuitry; Piezoelectric transducer; Resonant effect

Indexed keywords

ADMITTANCE APPROACH; DYNAMIC INTERACTION; EXPERIMENTAL INVESTIGATIONS; FREQUENCY VEERING; HIGH FREQUENCY MEASUREMENTS; INDUCTIVE CIRCUITS; KEY FEATURE; MEASUREMENT CIRCUIT; MECHANICAL STRUCTURES; ORDER OF MAGNITUDE; RESONANT EFFECT; SENSING SYSTEMS; SENSOR UNITS;

ACOUSTOOPTICAL EFFECTS; AMPLIFICATION; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; SENSORS;

DAMAGE DETECTION;

EID: 77951216752     PISSN: 1045389X     EISSN: 15308138     Source Type: Journal    
DOI: 10.1177/1045389X10364863     Document Type: Article

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