|
Volumn , Issue , 2003, Pages 727-730
|
Text mining for a clear picture of defect reports: A praxis report
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 77951205447
PISSN: 15504786
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
|
References (5)
|