메뉴 건너뛰기




Volumn , Issue , 2009, Pages 1685-1688

Induced signals in X-ray detectors with steering grid geometry

Author keywords

[No Author keywords available]

Indexed keywords

3D SIMULATIONS; ADJOINT SIMULATION; CDTE; CONVECTION AND DIFFUSION; FINITE ELEMENT SOFTWARE; GAAS; HIGH FLUX; INDUCED SIGNAL; INTERACTING PHOTONS; PROCESS NEEDS; SEMICONDUCTOR SENSORS; SENSOR MATERIALS; SIGNAL INDUCTION; SIGNAL SHAPES; SINGLE PHOTON COUNTING; SIZE AND SHAPE; X-RAY DETECTOR;

EID: 77951182146     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2009.5402235     Document Type: Conference Paper
Times cited : (4)

References (7)
  • 1
    • 0036815755 scopus 로고    scopus 로고
    • Medipix2: A 64-k pixel readout chip with 55-μm square elements working in single photon counting mode
    • X. Llopart, M. Campbell, R. Dinapoli, D. San Segundo, and E. Pernigotti, "Medipix2: A 64-k pixel readout chip with 55-μm square elements working in single photon counting mode," IEEE Trans. Nucl. Sci., vol. 49, no. 5, pp. 2279-2283, 2002.
    • (2002) IEEE Trans. Nucl. Sci. , vol.49 , Issue.5 , pp. 2279-2283
    • Llopart, X.1    Campbell, M.2    Dinapoli, R.3    San Segundo, D.4    Pernigotti, E.5
  • 3
    • 21544448810 scopus 로고
    • Currents induced by electron motion
    • S. Ramo, "Currents induced by electron motion," Proceedings of the I.R.E., vol. 27, pp. 584-585, 1939.
    • (1939) Proceedings of the I.R.E. , vol.27 , pp. 584-585
    • Ramo, S.1
  • 4
    • 0001063121 scopus 로고    scopus 로고
    • Method for mapping charge pulses in semiconductor radiation detectors
    • Feb.
    • T. H. Prettyman, "Method for mapping charge pulses in semiconductor radiation detectors," Nucl. Instr. and Meth. A, vol. 422, no. 1-3, pp. 232-237, Feb. 1999.
    • (1999) Nucl. Instr. and Meth. A , vol.422 , Issue.1-3 , pp. 232-237
    • Prettyman, T.H.1
  • 5
    • 62749101243 scopus 로고    scopus 로고
    • Generalised adjoint simulation of induced signals in semiconductor X-ray pixel detectors
    • B. Kreisler, G. Anton, J. Durst, and T. Michel, "Generalised adjoint simulation of induced signals in semiconductor X-ray pixel detectors" 2008 JINST 3 P11002.
    • 2008 JINST 3 P11002
    • Kreisler, B.1    Anton, G.2    Durst, J.3    Michel, T.4
  • 6
    • 44649129959 scopus 로고    scopus 로고
    • Monte carlo simulations in x-ray imaging
    • J. Giersch and J. Durst, "Monte carlo simulations in x-ray imaging," Nucl. Instr. and Meth. A, vol. 591, pp. 300-305, 2008.
    • (2008) Nucl. Instr. and Meth. A , vol.591 , pp. 300-305
    • Giersch, J.1    Durst, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.