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Volumn 96, Issue 14, 2010, Pages

Residual strain in thermally annealed periodic mesoporous silica revealed by x-ray scattering

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; FIRST SHARP DIFFRACTION PEAK; MESOPOROUS SILICA; NANOSTRUCTURED GLASS; RESIDUAL STRAINS; SMALL ANGLE X-RAY SCATTERING; TEMPERATURE DEPENDENCIES;

EID: 77951153503     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3380663     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.