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Volumn 5, Issue 2, 2008, Pages 606-608

Modelling the light induced metastable effects in amorphous silicon

Author keywords

[No Author keywords available]

Indexed keywords

AMPHOTERIC NATURE; CHARGE STATE; CHARGED STATE; DEFECT CREATION; DEGRADATION PROCESS; DYNAMIC SCALING; GAP STATE; LIGHT-INDUCED DEGRADATION; METASTABLE EFFECT; RECOMBINATION CENTRES; SIMULATION APPROACH; SIMULATION RESULT; STATE DENSITIES;

EID: 77951132109     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200776804     Document Type: Conference Paper
Times cited : (3)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.