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Volumn 5, Issue 5, 2008, Pages 1125-1128
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Spectroscopic ellipsometry analysis of multilayered TiO2-Ag thin films for photochromic application
c
HORIBA LTD
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
AG FILMS;
CONCENTRATION OF;
DIELECTRIC FUNCTIONS;
LOADED METAL;
LOW CONCENTRATIONS;
MAGNETRON SPUTTERING METHOD;
METAL PARTICLE;
MULTI-LAYERED;
PLASMA RESONANCE;
QUARTZ SUBSTRATE;
RED SHIFT;
SURFACE PLASMA RESONANCES;
TIO;
OXIDE MINERALS;
PHOTOCHROMISM;
QUARTZ;
SPECTROSCOPIC ANALYSIS;
SPECTROSCOPIC ELLIPSOMETRY;
SURFACE PLASMON RESONANCE;
SILVER;
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EID: 77951131857
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200777759 Document Type: Conference Paper |
Times cited : (2)
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References (12)
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