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Volumn 5, Issue 5, 2008, Pages 1125-1128

Spectroscopic ellipsometry analysis of multilayered TiO2-Ag thin films for photochromic application

Author keywords

[No Author keywords available]

Indexed keywords

AG FILMS; CONCENTRATION OF; DIELECTRIC FUNCTIONS; LOADED METAL; LOW CONCENTRATIONS; MAGNETRON SPUTTERING METHOD; METAL PARTICLE; MULTI-LAYERED; PLASMA RESONANCE; QUARTZ SUBSTRATE; RED SHIFT; SURFACE PLASMA RESONANCES; TIO;

EID: 77951131857     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777759     Document Type: Conference Paper
Times cited : (2)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.