Electronic structure of Mn in (Zn, Mn)O probed by resonant X-ray emission spectroscopy

Solid State Communications

Volumn 150, Issue 23-24, 2010, Pages 1065-1068

  Jin, J ^a   Chang, G S ^b   Xu, W ^a   Zhou, Y X ^a   Boukhvalov, D W ^d   Finkelstein, L D ^c   Kurmaev, E Z ^c   Zhang, X Y ^a   Moewes, A ^b  

^a Surface Physics Laboratory National Key Laboratory   (China)

^b UNIVERSITY OF SASKATCHEWAN   (Canada)

^c INSTITUTE OF METAL PHYSICS   (Russian Federation)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

A. (Zn, Mn)O; D. Free charge carriers; E. Resonant X ray emission spectroscopy

Indexed keywords

ANTIFERROMAGNETICS; D-D EXCITATIONS; EMISSION LINES; ENERGY LOSS; FREE CHARGE CARRIERS; INTENSITY RATIO; MN CONCENTRATIONS; MN-DOPED; RESONANT EXCITATION; RESONANT X-RAY EMISSION SPECTROSCOPIES; SPECTRAL FEATURE;

ANTIFERROMAGNETISM; CHARGE CARRIERS; ELECTROMAGNETIC WAVE EMISSION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; ENERGY DISSIPATION; FERROMAGNETIC MATERIALS; FERROMAGNETISM; ION BEAMS; MANGANESE COMPOUNDS; PARAMAGNETIC RESONANCE; X RAY SCATTERING; ZINC;

MANGANESE;

EID: 77951121282     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2010.03.006     Document Type: Article

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