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Volumn 495, Issue 2, 2010, Pages 377-381

Amorphous/nanocrystalline composites analysed by the Rietveld method

Author keywords

Amorphous materials; Crystal structure; Quenching; Rapid solidification; X ray diffraction

Indexed keywords

AMORPHOUS METALS; BULK METALLIC GLASS; CRYSTALLISATION; GRENOBLE; HIGH INTENSITY; IN-SITU; MICROSTRUCTURE PARAMETERS; RUN NUMBERS; SEMICRYSTALLINE MATERIALS; STRUCTURAL INFORMATION; SYNCHROTRON BEAMS;

EID: 77951090440     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.11.024     Document Type: Article
Times cited : (18)

References (18)
  • 5
    • 0004326059 scopus 로고
    • Young R.A. (Ed), University Press, Oxford, UK
    • In: Young R.A. (Ed). The Rietveld Method (1993), University Press, Oxford, UK
    • (1993) The Rietveld Method


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.