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Volumn 495, Issue 2, 2010, Pages 377-381
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Amorphous/nanocrystalline composites analysed by the Rietveld method
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Author keywords
Amorphous materials; Crystal structure; Quenching; Rapid solidification; X ray diffraction
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Indexed keywords
AMORPHOUS METALS;
BULK METALLIC GLASS;
CRYSTALLISATION;
GRENOBLE;
HIGH INTENSITY;
IN-SITU;
MICROSTRUCTURE PARAMETERS;
RUN NUMBERS;
SEMICRYSTALLINE MATERIALS;
STRUCTURAL INFORMATION;
SYNCHROTRON BEAMS;
CHROMIUM;
CRYSTALLINE MATERIALS;
CRYSTALLIZATION;
GLASS;
HOLOGRAPHIC INTERFEROMETRY;
METALLIC GLASS;
QUENCHING;
RAPID SOLIDIFICATION;
RIETVELD ANALYSIS;
RIETVELD METHOD;
RIETVELD REFINEMENT;
X RAY DIFFRACTION;
CRYSTAL STRUCTURE;
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EID: 77951090440
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.11.024 Document Type: Article |
Times cited : (18)
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References (18)
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