Stress-induced χ(2) in silicon - Comparison between theoretical and experimental values

IEEE International Conference on Group IV Photonics GFP

Volumn , Issue , 2009, Pages 232-234

  Hon, Nick K ^a   Tsia, Kevin K ^a   Solli, Daniel R ^a   Jalali, Bahram ^a   Khurgin, Jacob B ^b  

^a University of California   (United States)

^b Johns Hopkins University   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL VALUES; STRESS-INDUCED; THEORETICAL ESTIMATION;

EID: 77951026795     PISSN: 19492081     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/GROUP4.2009.5338380     Document Type: Conference Paper

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