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Volumn 207, Issue 3, 2010, Pages 718-723
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Direct observation of particle flow in semi-solid alloys by synchrotron X-ray micro-radioscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS CAMERA;
DIRECT OBSERVATION;
FUTURE APPLICATIONS;
HARD X RAY;
IN-SITU;
LIQUID DRAINAGE;
PARTICLE FLOW;
PIXEL DETECTOR;
RADIOGRAPHIC IMAGES;
SEMI-SOLID ALUMINIUM;
SEMI-SOLID SLURRY;
SEMISOLID ALLOY;
SOLID PARTICLES;
SYNCHROTRON X RAYS;
THIXOTROPIC BEHAVIOUR;
X-RAY IMAGE;
AGGLOMERATION;
GERMANIUM;
GERMANIUM ALLOYS;
LIQUIDS;
SYNCHROTRONS;
X RAY RADIOGRAPHY;
ALUMINUM;
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EID: 77950989933
PISSN: 18626300
EISSN: 18626319
Source Type: Journal
DOI: 10.1002/pssa.200925329 Document Type: Article |
Times cited : (19)
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References (19)
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