Atomic force microscopy observation of the enamel roughness and depth profile after phosphoric acid etching

Journal of Electron Microscopy

Volumn 59, Issue 2, 2010, Pages 119-125

  Loyola Rodriguez, Juan Pablo ^a   Zavala Alonso, Veronica ^a   Reyes Vela, Enrique ^a   Patiño Marin, Nuria ^a   Ruiz, Facundo ^b   Anusavice, Kenneth J ^c  

^a Advanced General Dentistry Program   (United States)

^b UNIVERSIDAD AUTÓNOMA DE SAN LUIS POTOSÍ   (Mexico)

^c UNIVERSITY OF FLORIDA COLLEGE OF DENTISTRY   (United States)

Author keywords

AFM; Depth profile; Enamel; Phosphoric acid; Roughness

Indexed keywords

PHOSPHORIC ACID;

ARTICLE; ATOMIC FORCE MICROSCOPY; DENTAL ACID ETCHING; ENAMEL; HUMAN; METHODOLOGY; PREMOLAR TOOTH; SURFACE PROPERTY; TOOTH; ULTRASTRUCTURE;

ACID ETCHING, DENTAL; BICUSPID; DENTAL ENAMEL; HUMANS; MICROSCOPY, ATOMIC FORCE; PHOSPHORIC ACIDS; SURFACE PROPERTIES; TOOTH;

ATOMIC FORCE MICROSCOPY; ENAMELS; ETCHING; PHOSPHORIC ACID;

ACID-ETCHING; ATOMIC-FORCE-MICROSCOPY; CARIES LESIONS; CONDITION; DENTAL FLUOROSIS; DEPTH-PROFILE; ENAMEL SURFACE; MEAN PEAK-TO-VALLEY HEIGHT; SCOTCHBOND ETCHING; STATISTICALLY SIGNIFICANT DIFFERENCE;

SURFACE ROUGHNESS;

EID: 77950980907     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfp042     Document Type: Article

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