Selective surface modification of syndiotactic polystyrene films: A study by Fourier transform- and confocal-Raman spectroscopy

European Polymer Journal

Volumn 46, Issue 5, 2010, Pages 1004-1015

  Musto, P ^a   Borriello, A ^a   Agoretti, P ^b   Napolitano, T ^c   Florio, G Di ^a   Mensitieri, G ^b  

^a CNR   (Italy)

^b UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^c STMICROELECTRONICS   (Italy)

Author keywords

Confocal Raman spectroscopy; Depth profiling; FT Raman; Sulfonated polystyrene; Surface modification

Indexed keywords

AVERAGE COMPOSITION; CALIBRATION CURVES; CARRIER SOLVENT; CONFOCAL-RAMAN SPECTROSCOPY; CRYSTALLINE MODIFICATIONS; CRYSTALLINE STRUCTURE; DIFFUSIVITIES; FT-RAMAN; LOW-MOLECULAR WEIGHT; RAMAN DATA; SELECTIVE SURFACE MODIFICATION; SOLUBILITY VALUE; SOLUTION-CAST FILMS; SULFONATED POLYSTYRENE; SULFONATION DEGREE; SURFACE MODIFICATION; SYNDIOTACTIC POLYSTYRENES; SYNDIOTACTIC POLYSTYRENES (SPS); TRANSPORT CHARACTERISTICS;

CRYSTALLINE MATERIALS; POLYSTYRENES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SULFONATION;

DEPTH PROFILING;

EID: 77950961434     PISSN: 00143057     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eurpolymj.2010.02.011     Document Type: Article

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