Method for wettability characterization based on contact line pinning

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 81, Issue 4, 2010, Pages

  Dimitrov, D I ^a,b   Milchev, A ^a,c   Binder, K ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b UNIVERSITY OF FOOD TECHNOLOGIES   (Bulgaria)

^c INSTITUTE OF PHYSICAL CHEMISTRY   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT LINE PINNING; LENNARD JONES FLUID; LIQUID WALL; LIQUID-VAPOR INTERFACE; MOLECULAR DYNAMICS SIMULATIONS; NANO SCALE; SOLID WALL;

CONTACT ANGLE; LIQUIDS; VAPORS;

PHASE INTERFACES;

EID: 77950934336     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.81.041603     Document Type: Article

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58. Note that for a homogeneous wall, the solution of ∂ V e f f (l) / ∂ l ∂ l = l min = 0 yields l min → ∂, that is, an infinitely thick wetting layer.