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Volumn 42, Issue 4, 2010, Pages 247-251
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Influence of current density on the distribution of tungsten tracer in porous anodic alumina films
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Author keywords
Aluminium; Anodising; Porous anodic alumina; Tungsten tracer
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Indexed keywords
ALUMINIUM ANODISING;
ANODIC FILMS;
ANODISING;
BARRIER LAYERS;
EXPERIMENTAL INVESTIGATIONS;
FILM FORMATIONS;
FILM MATERIALS;
FREE REGION;
GROWTH MECHANISMS;
GROWTH PROCESS;
INNER REGION;
LONG RANGE ORDERS;
NANO LAYERS;
OXALIC ACID;
PORE WALL;
POROUS ANODIC ALUMINA;
POROUS ANODIC ALUMINA FILMS;
SCANNING AND TRANSMISSION ELECTRON MICROSCOPES;
ALUMINUM;
ALUMINUM SHEET;
ELECTRON MICROSCOPES;
METALLIC FILMS;
PORE PRESSURE;
QUAY WALLS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
TUNGSTEN;
ALUMINA;
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EID: 77950853334
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.3179 Document Type: Conference Paper |
Times cited : (4)
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References (14)
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