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Volumn E93-A, Issue 2, 2010, Pages 431-439

Evaluation of a multi-line de-embedding technique up to 110 GHz for millimeter-wave CMOS circuit design

Author keywords

60 GHz; Cmos amplifier; Deembedding; Millimeter wave; Transmission line

Indexed keywords

AMPLIFIERS (ELECTRONIC); CMOS INTEGRATED CIRCUITS; ELECTRIC LINES; HETEROJUNCTION BIPOLAR TRANSISTORS; INTEGRATED CIRCUIT DESIGN; MICROWAVE CIRCUITS; MILLIMETER WAVES; TIMING CIRCUITS;

EID: 77950837687     PISSN: 09168508     EISSN: 17451337     Source Type: Journal    
DOI: 10.1587/transfun.E93.A.431     Document Type: Article
Times cited : (36)

References (16)
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  • 9
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    • J.-L. Kuo, Z.-M. Tsai, K.-Y. Lin, and H. Wang, " A 50 to 70 GHz power amplifier using 90 nm CMOS technology, " IEEE Microw. Wireless Compon. Lett., vol. 19, no. 1, pp. 45-47, Jan. 2009.
    • (2009) IEEE Microw. Wireless Compon. Lett. , vol.19 , Issue.1 , pp. 45-47
    • Kuo, J.-L.1    Tsai, Z.-M.2    Lin, K.-Y.3    Wang, H.4
  • 11
    • 0026679924 scopus 로고
    • An improved deembedding technique for on-wafer high-frequency characterization
    • Jan
    • M. Koolen, J. Geelen, and M. Versleijen, " An improved deembedding technique for on-wafer high-frequency characterization, " Bipolar Circuits and Technology Meeting, vol. 19, no. 1, pp. 188-191, Jan. 1991.
    • (1991) Bipolar Circuits and Technology Meeting , vol.19 , Issue.1 , pp. 188-191
    • Koolen, M.1    Geelen, J.2    Versleijen, M.3
  • 12
    • 0026171562 scopus 로고    scopus 로고
    • A three-step method for the de-embedding of high-frequency S-parameter measurements
    • June 1991
    • H. Cho and D. E. Burk, " A three-step method for the de-embedding of high-frequency S-parameter measurements, " IEEE Trans. Electron Devices, vol. 38, no. 6, pp. 1371-1375, June 1991.
    • IEEE Trans. Electron Devices , vol.38 , Issue.6 , pp. 1371-1375
    • Cho, H.1    Burk, D.E.2
  • 13
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    • A simple through-only de-embedding method for on-wafer S-parameter measurements up to 110 GHz
    • June
    • H. Ito and K. Masu, " A simple through-only de-embedding method for on-wafer S-parameter measurements up to 110 GHz, " IEEE MTT-S International Microwave Symposium Digest, pp. 383-386, June 2008.
    • (2008) IEEE MTT-S International Microwave Symposium Digest , pp. 383-386
    • Ito, H.1    Masu, K.2
  • 14
    • 31744441107 scopus 로고    scopus 로고
    • De-embedding transmission line measurements for accurate modeling of IC designs
    • DOI 10.1109/TED.2005.861726
    • A. M. Mangan, S. P. Voinigescu, M.-T. Yang, and M. Tazlauanu, " Deembedding transmission line measurements for accurate modeling of IC designs, " IEEE Trans. Electron Devices, vol. 53, no. 2, pp. 235-241, Feb. 2006. (Pubitemid 43174037)
    • (2006) IEEE Transactions on Electron Devices , vol.53 , Issue.2 , pp. 235-241
    • Mangan, A.M.1    Voinigescu, S.P.2    Yang, M.-T.3    Tazlauanu, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.