New X-ray microprobe system for trace heavy element analysis using ultraprecise X-ray mirror optics of long working distance

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 616, Issue 2-3, 2010, Pages 270-272

  Terada, Yasuko ^a   Yumoto, Hirokatsu ^a   Takeuchi, Akihisa ^a   Suzuki, Yoshio ^a   Yamauchi, Kazuto ^b   Uruga, Tomoya ^a  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

XRF; Heavy element; High energy X ray; Microfocusing; Scanning X ray microprobe; Ultraprecise X ray mirror

Indexed keywords

HEAVY ELEMENTS; HIGH ENERGY X RAY; MICRO-PROBES; MICROFOCUSING; X RAY MIRRORS;

CADMIUM; HIGH ENERGY PHYSICS; MIRRORS; SCANNING; TRACE ANALYSIS; TRACE ELEMENTS; X RAYS;

X RAY ANALYSIS;

EID: 77950803897     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.12.030     Document Type: Article

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