Enhancing MIL-HDBK-217 reliability predictions with physics of failure methods

Advancing Microelectronics

Volumn 37, Issue 2, 2010, Pages 28-32

  McLeish, James G ^a   Hillman, Craig ^a  

^a DfR Solutions   (United States)

Author keywords

Design for reliability; MIL HDBK 217 DfR; Physics of failure; Reliability; Reliability assessment; Reliability by design; Reliability physics; Reliability prediction

Indexed keywords

DESIGN FOR RELIABILITY; DESIGN-RELIABILITY; MIL-HDBK-217 DFR; PHYSICS OF FAILURES; RELIABILITY ASSESSMENTS; RELIABILITY PREDICTION;

DESIGN; DURABILITY; ELECTRONIC EQUIPMENT; RELIABILITY ANALYSIS; STRESSES;

FORECASTING;

EID: 77950645442     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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