A technique for extending the precision and the range of temperature programmed desorption toward extremely low coverages

Review of Scientific Instruments

Volumn 81, Issue 3, 2010, Pages

  Haegel, Stefan ^a   Zecho, Thomas ^b   Wehner, Stefan ^a,c  

^a UNIVERSITY OF BAYREUTH   (Germany)

^b AREVA NP GMBH   (Germany)

^c University of Koblenz   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORBATE SYSTEMS; AUTOMATED SAMPLING; EXTRACTION OF INFORMATION; GAS DOSING; HIGH QUALITY; QUADRUPOLE MASS SPECTROMETER; REPRODUCIBILITIES; SAMPLE MANIPULATION; STATE OF THE ART; SURFACE BONDS;

ADSORBATES; AUTOMATION; COMPUTER CONTROL SYSTEMS; LIQUID NITROGEN; MASS SPECTROMETRY; SURFACE STRUCTURE;

TEMPERATURE PROGRAMMED DESORPTION;

EID: 77950617352     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3317478     Document Type: Article

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