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Review of Scientific Instruments

Volumn 81, Issue 3, 2010, Pages

A sensitive near-field microscope for thermal radiation

(3) Kajihara, Yusuke a,b Kosaka, Keishi a Komiyama, Susumu a

a UNIVERSITY OF TOKYO (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EVANESCENT WAVE; EXTERNAL ILLUMINATION; LONG-WAVELENGTH INFRARED; NEAR FIELD MICROSCOPY; NEAR-FIELD; QUARTZ TUNING FORK; ROOM TEMPERATURE; SAMPLE SURFACE; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SENSITIVE DETECTOR; SHEAR-FORCE MODE; SPATIAL RESOLUTION; THERMAL RADIATIONS; TUNGSTEN PROBES;

MICROSCOPES; OXIDE MINERALS; PHOTOTRANSISTORS; PROBES; QUARTZ; TUNGSTEN;

INFRARED RADIATION;

EID: 77950556864 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3360826 Document Type: Article

Times cited : (73)

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