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Volumn , Issue , 2007, Pages
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Refinement patterns for rapid development of dependable systems
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Author keywords
[No Author keywords available]
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Indexed keywords
APPLICATION AREA;
DEPENDABLE SYSTEMS;
DESIGN PATTERNS;
EVENT-B;
FORMAL FRAMEWORK;
FORMAL MODEL;
MECHANISATION;
PLUG-INS;
RAPID DEVELOPMENT;
TRIPLE MODULAR REDUNDANCY;
COMPUTATION THEORY;
FORMAL METHODS;
MACHINERY;
TECHNICAL PRESENTATIONS;
FAULT TOLERANT COMPUTER SYSTEMS;
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EID: 77950501563
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/1316550.1316560 Document Type: Conference Paper |
Times cited : (9)
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References (6)
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