Structural, dielectric, and ferroelectric properties of BiAlO 3-PbTiO3 solid solution thin films on indium tin oxide-coated glass substrates

Journal of the American Ceramic Society

Volumn 93, Issue 4, 2010, Pages 925-927

  Wu, Guangheng ^a   Zhou, Hong ^a   Zhou, Xiaoye ^a   Qin, Ni ^a   Bao, Dinghua ^a  

^a SUN YAT SEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; CHEMICAL SOLUTION DEPOSITION METHOD; COATED GLASS SUBSTRATES; DETECTABLE SECONDARY PHASE; FERROELECTRIC PROPERTY; HIGH DIELECTRIC CONSTANTS; INDIUM TIN OXIDE; PEROVSKITE STRUCTURES; PSEUDOCUBIC; RAMAN ANALYSIS; REMANENT POLARIZATION; TETRAGONAL PHASE; XRD;

BISMUTH; CRYSTALLIZATION; DEPOSITION; DIELECTRIC LOSSES; FERROELECTRIC FILMS; FERROELECTRICITY; GLASS; INDIUM; OXIDE FILMS; OXIDE MINERALS; PEROVSKITE; PHOTOLITHOGRAPHY; SOLIDIFICATION; SUBSTRATES; THIN FILMS; TIN; TITANIUM COMPOUNDS; VAPOR DEPOSITION; X RAY DIFFRACTION;

SOLID SOLUTIONS;

EID: 77950477877     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2009.03495.x     Document Type: Article

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