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Volumn 96, Issue 12, 2010, Pages

Aging-stabilization of ferroelectric domains and internal electric field due to short-range ordering of charged point defects: Phase field modeling

(3) Rao, Wei Feng a Cheng, Tian Le a Wang, Yu U a

a Michigan Technological University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING PHENOMENA; COMPUTER MODELING AND SIMULATION; EXPERIMENTAL DATA; FERROELECTRIC DOMAINS; INDUCED FERROELECTRIC PHASE; INTERNAL ELECTRIC FIELDS; INTERNAL FIELD; PHASE FIELD MODELS; PHASE-FIELD MODELING; SHORT RANGE ORDERING; STABILIZATION EFFECTS; THERMO DYNAMIC ANALYSIS;

COMPUTATIONAL METHODS; DEFECTS; ELECTRIC FIELDS; FERROELECTRIC MATERIALS; FERROELECTRICITY; PHASE TRANSITIONS; POINT DEFECTS; STABILIZATION; THERMOANALYSIS;

COMPUTER SIMULATION;

EID: 77950337006 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3371722 Document Type: Article

Times cited : (11)

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