-
1
-
-
33846006566
-
-
NMAACR 1476-1122,. 10.1038/nmat1805
-
R. Ramesh and N. A. Spaldin, Nature Mater. NMAACR 1476-1122 6, 21 (2007). 10.1038/nmat1805
-
(2007)
Nature Mater.
, vol.6
, pp. 21
-
-
Ramesh, R.1
Spaldin, N.A.2
-
2
-
-
34948867759
-
-
JOELFJ 1385-3449,. 10.1007/s10832-007-9042-5
-
S. Priya, R. Islam, S. X. Dong, and D. Viehland, J. Electroceram. JOELFJ 1385-3449 19, 147 (2007). 10.1007/s10832-007-9042-5
-
(2007)
J. Electroceram.
, vol.19
, pp. 147
-
-
Priya, S.1
Islam, R.2
Dong, S.X.3
Viehland, D.4
-
3
-
-
39349110724
-
-
JAPIAU 0021-8979,. 10.1063/1.2836410
-
C. -W. Nan, M. I. Bichurin, S. X. Dong, D. Viehland, and G. Srinivasan, J. Appl. Phys. JAPIAU 0021-8979 103, 031101 (2008). 10.1063/1.2836410
-
(2008)
J. Appl. Phys.
, vol.103
, pp. 031101
-
-
Nan, C.-W.1
Bichurin, M.I.2
Dong, S.X.3
Viehland, D.4
Srinivasan, G.5
-
4
-
-
34648828947
-
-
APPLAB 0003-6951,. 10.1063/1.2789391
-
J. Y. Zhai, S. X. Dong, Z. P. Xing, J. F. Li, and D. Viehland, Appl. Phys. Lett. APPLAB 0003-6951 91, 123513 (2007). 10.1063/1.2789391
-
(2007)
Appl. Phys. Lett.
, vol.91
, pp. 123513
-
-
Zhai, J.Y.1
Dong, S.X.2
Xing, Z.P.3
Li, J.F.4
Viehland, D.5
-
5
-
-
40649126181
-
-
CSTCEH 0266-3538,. 10.1016/j.compscitech.2007.10.046
-
Y. -M. Jia, F. -F. Wang, X. -Y. Zhao, H. -S. Luo, S. W. Or, and H. L. W. Chan, Compos. Sci. Technol. CSTCEH 0266-3538 68, 1440 (2008). 10.1016/j.compscitech.2007.10.046
-
(2008)
Compos. Sci. Technol.
, vol.68
, pp. 1440
-
-
Jia, Y.-M.1
Wang, F.-F.2
Zhao, X.-Y.3
Luo, H.-S.4
Or, S.W.5
Chan, H.L.W.6
-
6
-
-
67650509031
-
-
ITUCER 0885-3010,. 10.1109/TUFFC.2009.1215
-
C. L. Zhang, W. Q. Chen, J. Y. Li, and J. S. Yang, IEEE Trans. Ultrason. Ferroelectr. Freq. Control ITUCER 0885-3010 56, 1046 (2009). 10.1109/TUFFC.2009.1215
-
(2009)
IEEE Trans. Ultrason. Ferroelectr. Freq. Control
, vol.56
, pp. 1046
-
-
Zhang, C.L.1
Chen, W.Q.2
Li, J.Y.3
Yang, J.S.4
-
7
-
-
62549137455
-
-
APPLAB 0003-6951,. 10.1063/1.3095596
-
C. L. Zhang, W. Q. Chen, S. H. Xie, J. S. Yang, and J. Y. Li, Appl. Phys. Lett. APPLAB 0003-6951 94, 102907 (2009). 10.1063/1.3095596
-
(2009)
Appl. Phys. Lett.
, vol.94
, pp. 102907
-
-
Zhang, C.L.1
Chen, W.Q.2
Xie, S.H.3
Yang, J.S.4
Li, J.Y.5
-
8
-
-
39349097490
-
-
APPLAB 0003-6951,. 10.1063/1.2837185
-
S. H. Xie, J. Y. Li, Y. Qiao, Y. Y. Liu, L. N. Lan, Y. C. Zhou, and S. T. Tan, Appl. Phys. Lett. APPLAB 0003-6951 92, 062901 (2008). 10.1063/1.2837185
-
(2008)
Appl. Phys. Lett.
, vol.92
, pp. 062901
-
-
Xie, S.H.1
Li, J.Y.2
Qiao, Y.3
Liu, Y.Y.4
Lan, L.N.5
Zhou, Y.C.6
Tan, S.T.7
-
9
-
-
48849104459
-
-
JAPIAU 0021-8979,. 10.1063/1.2959831
-
S. H. Xie, J. Y. Li, Y. Qiao, Y. Y. Liu, L. N. Lan, G. Jin, and Y. C. Zhou, J. Appl. Phys. JAPIAU 0021-8979 104, 024115 (2008). 10.1063/1.2959831
-
(2008)
J. Appl. Phys.
, vol.104
, pp. 024115
-
-
Xie, S.H.1
Li, J.Y.2
Qiao, Y.3
Liu, Y.Y.4
Lan, L.N.5
Jin, G.6
Zhou, Y.C.7
-
10
-
-
57349191102
-
-
APPLAB 0003-6951,. 10.1063/1.3040010
-
S. H. Xie, J. Y. Li, R. Proksch, Y. M. Liu, Y. C. Zhou, Y. Y. Liu, Y. Ou, L. N. Lan, and Y. Qiao, Appl. Phys. Lett. APPLAB 0003-6951 93, 222904 (2008). 10.1063/1.3040010
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 222904
-
-
Xie, S.H.1
Li, J.Y.2
Proksch, R.3
Liu, Y.M.4
Zhou, Y.C.5
Liu, Y.Y.6
Ou, Y.7
Lan, L.N.8
Qiao, Y.9
-
11
-
-
67650474589
-
-
APPLAB 0003-6951,. 10.1063/1.3176981
-
C. L. Zhang, J. S. Yang, and W. Q. Chen, Appl. Phys. Lett. APPLAB 0003-6951 95, 013511 (2009). 10.1063/1.3176981
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 013511
-
-
Zhang, C.L.1
Yang, J.S.2
Chen, W.Q.3
-
12
-
-
70350681820
-
-
SMSTER 0964-1726,. 10.1088/0964-1726/18/9/095026
-
C. L. Zhang, W. Q. Chen, J. Y. Li, and J. S. Yang, Smart Mater. Struct. SMSTER 0964-1726 18, 095026 (2009). 10.1088/0964-1726/18/9/095026
-
(2009)
Smart Mater. Struct.
, vol.18
, pp. 095026
-
-
Zhang, C.L.1
Chen, W.Q.2
Li, J.Y.3
Yang, J.S.4
-
14
-
-
52649127376
-
-
ITUCER 0885-3010,. 10.1109/TUFFC.2008.903
-
H. Xue, Y. T. Hu, and Q. M. Wang, IEEE Trans. Ultrason. Ferroelectr. Freq. Control ITUCER 0885-3010 55, 2104 (2008). 10.1109/TUFFC.2008.903
-
(2008)
IEEE Trans. Ultrason. Ferroelectr. Freq. Control
, vol.55
, pp. 2104
-
-
Xue, H.1
Hu, Y.T.2
Wang, Q.M.3
|