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Volumn 19, Issue 3, 2010, Pages 301-319

Cohesive zone model applied to creep crack initiation at an interface edge between submicron thick films

Author keywords

Cohesive zone model; Crack initiation; Creep; Interface strength; Thin film

Indexed keywords

COHESIVE LAWS; COHESIVE ZONE MODEL; CREEP CRACK INITIATION; DAMAGE MECHANICS; FEM SIMULATIONS; FINITE ELEMENT CODES; INTERFACE STRENGTH; MICRO-CANTILEVERS; MICRO-ELECTRONIC DEVICES; PARAMETERS CHARACTERIZING; SILICON FILMS; STRESS SINGULARITIES; SUBMICRON; TIME CURVES; USER SUBROUTINE;

EID: 77950277830     PISSN: 10567895     EISSN: 15307921     Source Type: Journal    
DOI: 10.1177/1056789509103651     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.