Studies of anions from sputtering III: The 41K background in 41 CaF3- measurement by AMS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 7-8, 2010, Pages 816-819

  Zhao, X L ^a,b   Eliades, J ^a   Liu, Q ^b   Kieser, W E ^a   Litherland, A E ^a   Ye, S ^c   Cousins, Lisa ^c  

^a UNIVERSITY OF TORONTO   (Canada)

^b Chinese Academy of Sciences   (China)

^c IONICS Mass Spectrometry Group   (Canada)

Author keywords

41Ca AMS background; CaF3 ; CID; Cs impurity; KF3

Indexed keywords

41CA AMS BACKGROUND; COLLISION INDUCED DISSOCIATION; IMPURITIES IN; LOW LEVEL; MOLECULAR IONS; SPUTTER SOURCES; THREE ORDERS OF MAGNITUDE;

CALCIUM; CESIUM; IMPURITIES; ION SOURCES;

NEGATIVE IONS;

EID: 77950260169     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.10.038     Document Type: Article

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