Optimal Estimation of Contour Properties by Cross-Validated Regularization

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 11, Issue 6, 1989, Pages 600-610

  Shahraray, Behzad ^a   Anderson, David J ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Cross validation; digitized contours; feature extraction; regularization; smoothing spline approximation; statistical estimation

Indexed keywords

EID: 77950220384     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.24794     Document Type: Article

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