Structural information-based image quality assessment using LU factorization

IEEE Transactions on Consumer Electronics

Volumn 55, Issue 1, 2009, Pages 165-171

  Han, Ho Sung ^a   Kim, Dong O ^a   Park, Rae Hong ^a  

^a Sogang University   (South Korea)

Author keywords

DMOS; Image quality assessment; logistic regression; LU factorization; structural information

Indexed keywords

DMOS; IMAGE QUALITY ASSESSMENT; LOGISTIC REGRESSIONS; LU FACTORIZATION; STRUCTURAL INFORMATION;

ALGORITHMS; CORRELATION METHODS; FACTORIZATION; MEAN SQUARE ERROR; REGRESSION ANALYSIS;

IMAGE QUALITY;

EID: 77950151089     PISSN: 00983063     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCE.2009.4814430     Document Type: Article

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