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Volumn , Issue , 2009, Pages 1197-1200
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Characterization setup for device level dynamic load modulation measurements
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Author keywords
LDMOS; Load modulation; Load pull
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Indexed keywords
BACK-OFF;
CHARACTERIZATION METHODS;
DEVICE OPERATIONS;
DYNAMIC MEASUREMENT;
HIGHER EFFICIENCY;
LDMOS DEVICES;
LOAD IMPEDANCE;
LOAD MODULATION;
LOAD-PULL;
MEASURED RESULTS;
ON-WAFER MEASUREMENTS;
STATIC CHARACTERIZATION;
DYNAMIC LOADS;
DYNAMIC PROGRAMMING;
INSULATING MATERIALS;
MICROWAVES;
MOS DEVICES;
MODULATION;
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EID: 77949969562
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/MWSYM.2009.5165917 Document Type: Conference Paper |
Times cited : (8)
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References (4)
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